4. Literature

Below is a list of references that are cited in the emicroml documentation:

[Ricolleau1]

 “Random vs realistic amorphous carbon models for high resolution microscopy and electron diffraction”, C. Ricolleau et al., J. Appl. Phys. 114, 21 (2013), doi:10.1063/1.4831669

[Boothroyd1]

 “Quantification of high-resolution electron microscope images of amorphous carbon”, C.B. Boothroyd, Ultramicroscopy 83, 3-4 (2000), doi:10.1016/S0304-3991(00)00012-7

[Schonfeld1]

 “Anisotropic mean-square displacements (MSD) in single-crystals of 2*H*- and 3*R*-\(\text{MoS}_2\)”, B. Schönfeld et al., Acta Cryst. 83, 404-407 (1983), doi:10.1107/S0108768183002645

[Mahr1]

 “Influence of distortions of recorded diffraction patterns on strain analysis by nano-beam electron diffraction”, C. Mahr et al., Ultramicroscopy 196, 74-82 (2019), doi:10.1016/j.ultramic.2018.09.010

[Hawkes1]

 “Principles of Electron Optics, Volume One: Basic Geometrical Optics”, P. Hawkes and E. Kasper, Academic Press (2018), doi:10.1016/C2015-0-06653-9